Download e-book for kindle: Built-in-Self-Test and Digital Self-Calibration for RF SoCs by Sleiman Bou-Sleiman, Mohammed Ismail

By Sleiman Bou-Sleiman, Mohammed Ismail

ISBN-10: 1441995471

ISBN-13: 9781441995476

ISBN-10: 144199548X

ISBN-13: 9781441995483

This e-book will introduce layout methodologies, referred to as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which counterpoint the robustness of radio frequency (RF) and millimeter wave (mmWave) built-in circuits (ICs). those circuits are utilized in present and rising communique, computing, multimedia and biomedical items and microchips. The layout methodologies provided will bring about improving the yield (percentage of operating chips in a excessive quantity run) of RF and mmWave ICs with a view to let winning production of such microchips in excessive quantity.

Show description

By Sleiman Bou-Sleiman, Mohammed Ismail

ISBN-10: 1441995471

ISBN-13: 9781441995476

ISBN-10: 144199548X

ISBN-13: 9781441995483

This e-book will introduce layout methodologies, referred to as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which counterpoint the robustness of radio frequency (RF) and millimeter wave (mmWave) built-in circuits (ICs). those circuits are utilized in present and rising communique, computing, multimedia and biomedical items and microchips. The layout methodologies provided will bring about improving the yield (percentage of operating chips in a excessive quantity run) of RF and mmWave ICs with a view to let winning production of such microchips in excessive quantity.

Show description

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Picos, S. Bota, M. Roca, E. Isern, “Compact Frequency Offset Circuit for Testing IC RF Transceivers,” Solid-State and Integrated Circuit Technology, 2006. 2125–2128, Oct. 2006 7. S. Bhattacharya, A. Chatterjee, “A built-in loopback test methodology for RF transceiver circuits using embedded sensor circuits,” Test Symposium, 2004. 13th Asian, pp. 68–73, Nov. 2004 8. N. Variyam, S. Cherubal, A. 349–361, Mar 2002 9. R. S. Akbay, S. Bhattacharya, S. Cherubal, A. 1018–1031, May 2007 Chapter 3 Efficient Testing for RF SoCs The implementation of self-test, as discussed in this book, is not geared exclusively for production testing but also for post-production.

To decrease the insertion loss, bigger switches are needed however this increases their capacitive contributions at high frequencies. The size of the switches should be taken into consideration when designing the rest of the circuits [5]. Internal node visibility: One of the downsides of loopback testing is the lack of information on the internal nodes of the end-to-end setup. This has been alleviated by the inclusion of small on-chip RF detectors that attach to these nodes and provide an easily readable measure of the RF signal.

14 Nonideal mixer effects domain that is coupled with a gain (active mixers) or loss (passive mixers). Therefore, an important metric is the conversion gain as well as linearity (second order intermodulation is critical here) and NF. Also, the mixer’s conversion gain is a function of the input LO power and the two must be carefully designed in conjunction, especially in IQ-type systems. Non-ideal isolation between the input ports results in self-mixing, feed through, and in-band intermodulation products (Fig.

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Built-in-Self-Test and Digital Self-Calibration for RF SoCs by Sleiman Bou-Sleiman, Mohammed Ismail


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